Fig.1 Disk test box
This document describes the setup for electrical testing of modules on a disk at NIKHEF, and the test sequence.
The disk is tested in a closed test box, equipped with cooling, DCS, power cables and fibers.
Fig.1 Disk test box
Fig.2 Power supply crate
Details and instructions can be found here.
Details and instructions can be found here.
SctRodDaq version 4.1.1 is installed, making use of online-00-22-00 and dataflow-00-10-00.
The wheel test sequence is as follows:
Put on protective cover.
Connect cooling pipes, open relevant valves, pressurise with N2 to about 20 bar for leak check of PPF0 connectors.
Connect power cables, fibres, DCS cables.
Still with non-diode protected dummy PPF0's.
Set Select switches on TPPF1-D appropriately
NTC's
Bias currents: IV curve to 450 V (Hamamatsu), 400 V (CIS)
Swap dummy-PPF0's for voltage limited ones
Re-check NTC's following dummy-PPF0 swap
Pin diode test: put 6V on diodes, send clock, read current
DCS checks
Close box and start drying out
Cooling on at warm condition (KVQ at 5 degC?)
Power VDD and VCSEL control voltage.
Use RODDAQ RxThresholdBasedOnConfigRegisterTest to check VCSEL light levels and find required VCSEL voltage
If necessary, the cooling can be turned off and the box will soon be
warm enough to open and to try fixing infineon connectors at PPF0 for
example.
Configuration: check Icc and Idd
Hard reset: clock/2 should come back
Select=1: get clock from neighbour (when uppers and lowers are on)
RX threshold scans for various VCSEL voltages, set thresholds on BOC
RX delay scans, set RX delays
Confirmation test (digital tests + strobe delay + 3pt gain)
Repeat confirmation test with select=1
Check all NTC's are similar